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Thursday, November 26, 2020 | History

2 edition of Techniques for measuring the integrity of passivation overcoats on integrated circuits found in the catalog.

Techniques for measuring the integrity of passivation overcoats on integrated circuits

Werner Kern

Techniques for measuring the integrity of passivation overcoats on integrated circuits

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  • 39 Currently reading

Published by National Bureau of Standards in Washington .
Written in English


Edition Notes

Statementby Werner Kern and Robert B. Comizzoli.
SeriesSemiconductor measurement technology, Special publication -- 400-31.
ContributionsComizzoli, Robert B.
ID Numbers
Open LibraryOL18783821M


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Techniques for measuring the integrity of passivation overcoats on integrated circuits by Werner Kern Download PDF EPUB FB2

Get this from a library. Semiconductor measurement technology: techniques for measuring the integrity of passivation overcoats on integrated circuits. [Werner Kern; Robert B Comizzoli; United States.

National Bureau of Standards.; United States. Defense Advanced Research Projects Agency.; Radio Corporation of America. Laboratories Division.]. Additional Physical Format: Online version: Kern, Werner, Techniques for measuring the integrity of passivation overcoats on integrated circuits.

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